The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 05, 2026
Filed:
Mar. 19, 2024
Ventana Medical Systems, Inc., Tucson, AZ (US);
Qinle BA, San Mateo, CA (US);
Jim F. Martin, Mountain View, CA (US);
Karel J. Zuiderveld, Boulder, CO (US);
Uwe Horchner, Woodside, CA (US);
Ventana Medical Systems, Inc., Tucson, AZ (US);
Abstract
Method and systems for of using a machine-learning model to detect predicted artifacts at a target image resolution are provided. A machine-learning model trained to detect artifact pixels in images at a target image resolution is accessed. An image depicting at least part of the biological sample at an initial image resolution can be converted at the target image resolution. The machine-learning model is applied to the converted image to identify one or more artifact pixels from the converted image. Method and systems for training the machine-learning model to detect predicted artifacts at the target image resolution are also provided.