The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 05, 2026
Filed:
Aug. 14, 2023
Applicant:
Baker Hughes Holdings Llc, Houston, TX (US);
Inventor:
Clark A. Bendall, Skaneateles, NY (US);
Assignee:
Baker Hughes Holdings LLC, Houston, TX (US);
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 7/13 (2017.01); G06T 7/73 (2017.01);
U.S. Cl.
CPC ...
G06T 7/13 (2017.01); G06T 7/73 (2017.01); G06T 2207/20101 (2013.01);
Abstract
A method for measuring a feature near the edge of an object comprising receiving image data characterizing the object, identifying an edge of the object, identifying a point on the perimeter of the feature at a position opposite the edge of the object, determining a reference plane, determining a three-dimensional reference line on the reference plane associated with the edge of the object, determining a three-dimensional measurement point on the reference plane based on the point on the perimeter of the feature, and determining the perpendicular distance from the measurement point to the reference line.