The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 05, 2026

Filed:

Apr. 26, 2022
Applicant:

Vanderbilt University, Nashville, TN (US);

Inventors:

Benoit M. Dawant, Nashville, TN (US);

Jianing Wang, Nashville, TN (US);

Jack H. Noble, Nashville, TN (US);

Robert F. Labadie, Nashville, TN (US);

Assignee:

VANDERBILT UNIVERSITY, Nashville, TN (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); G06T 3/02 (2024.01); G06T 3/18 (2024.01); G06T 7/30 (2017.01); G06T 17/20 (2006.01); G06V 10/25 (2022.01);
U.S. Cl.
CPC ...
G06T 7/0012 (2013.01); G06T 3/02 (2024.01); G06T 3/18 (2024.01); G06T 7/30 (2017.01); G06T 17/20 (2013.01); G06V 10/25 (2022.01); G06T 2207/10081 (2013.01); G06T 2207/20132 (2013.01); G06T 2207/30016 (2013.01); G06T 2207/30048 (2013.01);
Abstract

Methods and systems for segmentation of structures of interest (SOI) in a CT image post-operatively acquired with an implant user in a region of interest in which an implant is implanted. The method includes inputting the post-operatively acquired CT (Post-CT) image to trained networks to generate a dense deformation field (DDF) from the input Post-CT image to an atlas image; and warping a segmentation mesh of the SOI in the atlas image to the input Post-CT image using the DDF so as to generate the segmentation mesh of the SOI in the input Post-CT image, wherein the segmentation mesh of the SOI in the atlas image is generated by applying an active shape model-based method to the atlas image.


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