The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 05, 2026

Filed:

May. 04, 2023
Applicant:

Tencent Cloud Computing (Beijing) Co., Ltd., Beijing, CN;

Inventors:

Tianliang Zhang, Beijing, CN;

Jinxiang Lai, Beijing, CN;

Liqiang Bao, Beijing, CN;

Yi Zeng, Beijing, CN;

Jun Liu, Beijing, CN;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); G06T 3/4007 (2024.01); G06T 5/40 (2006.01); G06T 7/11 (2017.01); G06V 10/25 (2022.01); G06V 10/74 (2022.01);
U.S. Cl.
CPC ...
G06T 7/001 (2013.01); G06T 3/4007 (2013.01); G06T 5/40 (2013.01); G06T 7/11 (2017.01); G06V 10/25 (2022.01); G06V 10/761 (2022.01); G06T 2207/30152 (2013.01); G06V 2201/07 (2022.01);
Abstract

An image processing method, apparatus, and device, and a storage medium relate to the field of artificial intelligence. The method may include: obtaining an image corresponding to a target battery module, the target battery module including N solder joints, and the N solder joints being respectively mapped to N solder joint fields in the image; dividing the image according to the N solder joint fields to obtain N image regions in one-to-one correspondence with the N solder joint fields; calculating image difference information between each pair of adjacent image regions among the N image regions to obtain an image difference information set; and performing fault recognition on the target battery module based on the image difference information set. The accuracy for recognizing a preset fault in a battery module can be improved by the method.


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