The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 05, 2026

Filed:

Nov. 06, 2020
Applicant:

Amgen Inc., Thousand Oaks, CA (US);

Inventors:

Neelima Chavali, Newbury Park, CA (US);

Thomas C. Pearson, Newbury Park, CA (US);

Manuel A. Soto, Caguas, PR;

Jorge Delgado Torres, Caguas, PR;

Roberto C. Alvarado Rentas, Caguas, PR;

Javier O. Tapia, Gurabo, PR;

Sandra Rodriguez-Toledo, Trujillo Alto, PR;

Eric R. Flores-Acosta, San Juan, PR;

Osvaldo Perez, Guaynabo, PR;

Brenda A. Torres, San Juan, PR;

Assignee:

Amgen Inc., Thousand Oaks, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01);
U.S. Cl.
CPC ...
G06T 7/0004 (2013.01); G06T 2207/20081 (2013.01); G06T 2207/20084 (2013.01); G06T 2207/30108 (2013.01);
Abstract

In a method for enhancing accuracy and efficiency in automated visual inspection of vessels, a vessel containing a sample is oriented such that a line scan camera has a profile view of an edge of a stopper of the vessel. A plurality of images of the edge of the stopper is captured by the first line scan camera while spinning the vessel, where each image of the plurality of images corresponds to a different rotational position of the vessel. A two-dimensional image of the edge of the stopper is generated based on at least the plurality of images, and pixels of the two-dimensional image are processed, by one or more processors executing an inference model that includes a trained neural network, to generate output data indicative of a likelihood that the sample is defective.


Find Patent Forward Citations

Chavali, Neelima. (2026). Targeted application of deep learning to automated visual inspection equipment (U.S. Patent No. 12620075). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12620075

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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