The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 05, 2026

Filed:

May. 05, 2022
Applicants:

GE Precision Healthcare Llc, Wauwatosa, WI (US);

Purdue Research Foundation, West Lafayette, IN (US);

University of Notre Dame Du Lac, South Bend, IN (US);

Inventors:

Madhuri Mahendra Nagare, West Lafayette, IN (US);

Roman Melnyk, New Berlin, WI (US);

Obaidullah Rahman, South Bend, IN (US);

Ken Sauer, South Bend, IN (US);

Charles Bouman, Jr., West Lafayette, IN (US);

Assignees:

GE PRECISION HEALTHCARE LLC, Wauwatosa, WI (US);

PURDUE RESEARCH FOUNDATION, West Lafayette, IN (US);

UNIVERSITY OF NOTRE DAME DU LAC, South Bend, IN (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 5/70 (2024.01); G06F 18/214 (2023.01); G06T 7/00 (2017.01);
U.S. Cl.
CPC ...
G06T 5/70 (2024.01); G06F 18/214 (2023.01); G06T 7/0012 (2013.01); G06T 2207/10072 (2013.01);
Abstract

Systems and methods for computed tomography imaging are provided. In one embodiment, a method includes acquiring an image, inputting the image to a machine learning model to generate a denoised image, the machine learning model trained with a loss function that weights variance differently from bias, and outputting the denoised image. In this way, structural details in denoised CT images may be improved while maintaining textural information in the denoised images.


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