The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 05, 2026

Filed:

Dec. 27, 2021
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Inventors:

Qingfeng Liu, San Diego, CA (US);

Hai Su, San Diego, CA (US);

Mostafa El-Khamy, San Diego, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 5/20 (2006.01); G06T 3/403 (2024.01); G06T 7/12 (2017.01); G06V 10/44 (2022.01); G06V 20/70 (2022.01);
U.S. Cl.
CPC ...
G06T 5/20 (2013.01); G06T 3/403 (2013.01); G06T 7/12 (2017.01); G06V 10/443 (2022.01); G06V 20/70 (2022.01); G06T 2207/20021 (2013.01); G06T 2207/20081 (2013.01);
Abstract

A method of image processing includes: determining a first feature, wherein the first feature has a dimensionality D1; determining a second feature, wherein the second feature has a dimensionality D2 and is based on an output of a feature extraction network; generating a third feature by processing the first feature, the third feature having a dimensionality D3; generating a guidance by processing the second feature, the guidance having the dimensionality D3; generating a filter output by applying a deep guided filter (DGF) to the third feature using the guidance; generating a map based on the filter output; and outputting a processed image based on the map.


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