The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 05, 2026
Filed:
Jan. 26, 2024
Dell Products L.p., Round Rock, TX (US);
Rustem Rafikov, Hopkinton, MA (US);
Christopher Jones, Plainville, MA (US);
Philippe Armangau, Kalispell, MT (US);
Sathya Krishna Murthy, Morrisville, NC (US);
Bruce A. Zimmerman, Concord, MA (US);
Dell Products L.P., Round Rock, TX (US);
Abstract
A technique is directed to generating test data to be written in a predefined testing environment. The technique includes receiving an entropy value indicating an amount of entropy of write data of a completed write operation to be mimicked by the test data, and a deduplication value indicating a target deduplication ratio of the test data in the predefined testing environment. The technique further includes identifying, based on the entropy value, a particular data buffer from a predefined plurality of data buffers. The technique further includes, after identifying the particular data buffer, modifying at least part of the particular data buffer based on the deduplication value to generate a modified data buffer as the test data.