The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 05, 2026

Filed:

Jun. 24, 2025
Applicant:

Wiz, Inc., New York, NY (US);

Inventors:

Nir Ohfeld, Tel Aviv, IL;

Shir Tamari, Tel Aviv, IL;

Assignee:

Wiz, Inc., New York, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 21/56 (2013.01); G06F 21/55 (2013.01);
U.S. Cl.
CPC ...
G06F 21/568 (2013.01); G06F 21/554 (2013.01);
Abstract

A system and method for forensic analysis of block level storage devices for detecting cybersecurity attacks is presented. The method includes accessing a disk in a computing environment, the disk including deleted data; recovering at least a file from the deleted data; initiating a forensic analysis on the at least a file to detect a forensic artifact, wherein the forensic artifact indicates a cybersecurity attack; detecting the forensic artifact on the on the at least a file; and initiating a remediation action on a virtualization associated with the disk based on the detected forensic artifact.


Find Patent Forward Citations

Ohfeld, Nir. (2026). System and method for cybersecurity forensic analysis based on deleted data (U.S. Patent No. 12619730). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12619730

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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