The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 05, 2026

Filed:

Jun. 25, 2019
Applicant:

Toshiba Mitsubishi-electric Industrial Systems Corporation, Tokyo, JP;

Inventors:

Ryo Shimizu, Tokyo, JP;

Naotake Miyasaka, Tokyo, JP;

Takato Sonoda, Tokyo, JP;

Assignee:

TMEIC CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 16/248 (2019.01); G01R 31/34 (2020.01); G06F 16/2458 (2019.01);
U.S. Cl.
CPC ...
G06F 16/248 (2019.01); G01R 31/346 (2013.01); G06F 16/2465 (2019.01);
Abstract

A plant monitoring system comprises: a data collection device configured to collect multiple measured values measured during a plant equipment inspection; and a trend graph display part configured to generate a trend graph based on the multiple measured values. The data collection device comprises: a measured value collection part configured to collect multiple measured values; an event number assignment part configured to assign a same event number or a different event number to the multiple measured values based on a time difference between times at which the multiple measured values were acquired; and a measured value storage part configured to store the multiple measured values. The trend graph display part is configured to render the multiple measured values stored in the measured value storage part in a graph having measured value as a first axis and event number as a second axis.


Find Patent Forward Citations

Loading…