The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 05, 2026
Filed:
Sep. 04, 2024
Hitachi, Ltd., Tokyo, JP;
Shinya Furukawa, Tokyo, JP;
Masaki Kimura, Tokyo, JP;
Kazumasa Tobe, Tokyo, JP;
Seiji Aguchi, Tokyo, JP;
HITACHI, LTD., Tokyo, JP;
Abstract
Provided is a system failure monitoring device capable of easily estimating a root cause of a system. A data collection unit acquires pod/calculation node information, which is configuration information regarding a pod that executes a process according to a request, and tracing data regarding the request processed by the pod. A determination unit including a processing time calculation unit and an abnormality degree calculation determination unit determines, for each of the requests, whether the request is an abnormal request relevant to an abnormality of a monitoring target system, based on the tracing data and the pod/calculation node information. A presentation unit including an abnormal request distribution calculation unit and an abnormal request visualization unit generates and presents visualized data indicating an abnormal request distribution obtained by plotting the abnormal request in a request space defined by a coordinate axis related to the requests.