The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 05, 2026
Filed:
Dec. 21, 2022
Leica Instruments (Singapore) Pte. Ltd., Singapore, SG;
George Themelis, Singapore, SG;
Leica Instruments (Singapore) Pte Ltd., Singapore, SG;
Abstract
Examples relate to a microscope system, such as a surgical microscope system, and to a corresponding method. The microscope system () comprises a microscope () with a first optical imaging sensor () for generating first imaging sensor data based on light having a first wavelength spectrum, a second optical imaging sensor () for generating second imaging sensor data based on light having a second wavelength spectrum, and a multispectral iris (), configured to provide an opening with a first numerical aperture for the light having the first wavelength spectrum and an opening with a second numerical aperture for the light having the second wavelength spectrum, with the first numerical aperture being different from the second numerical aperture. The microscope system comprises one or more processors (), configured to generate a composite image based on the first imaging sensor data and based on the second imaging sensor data.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile