The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 05, 2026

Filed:

Dec. 07, 2020
Applicants:

Khalifa University of Science and Technology, Abu Dhabi, AE;

British Telecommunications Plc, London, GB;

Emirates Telecommunications Corporation, Abu-Dhabi, AE;

Inventors:

James Aweya, Abu Dhabi, AE;

Nawaf Almoosa, Abu Dhabi, AE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01S 5/02 (2010.01); H04W 16/18 (2009.01); H04W 64/00 (2009.01);
U.S. Cl.
CPC ...
G01S 5/0242 (2013.01); G01S 5/0278 (2013.01); H04W 16/18 (2013.01); H04W 64/003 (2013.01);
Abstract

This invention relates to methods and systems for determining whether a reference point in a location system has changed used measurement residuals determined from an exchange of messages between reference points. In one embodiment a method of determining whether the location of a first one of a plurality of reference points used in a location system has changed is provided. The reference points each have a known initial position and the method includes the steps of: sending a wireless message between a second reference point and the first reference point and recording the times of sending and receipt of the wireless message; estimating, from the recorded times, an estimated distance between the first reference point and the second reference point; comparing the estimated distance to the actual distance between the known initial positions of the first and second reference points to determine a measurement residual; and determining, using the measurement residual, whether the location of the first reference point has changed.


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