The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 05, 2026
Filed:
Jan. 03, 2023
Nxp B.v., Eindhoven, NL;
Jan-Peter Schat, Hamburg, DE;
Paul Wielage, Waalre, NL;
NXP B.V., Eindhoven, NL;
Abstract
Various embodiments relate to a method of testing a plurality of devices of the same type wherein each of the plurality of devices of the same type include a built-in self-test device, including: randomly generating, by a processor, stimulus parameters; applying, by the built-in self-test devices, the generated stimulus parameters N times to the plurality of devices of the same type; measuring, by the plurality of devices of the same type, a response of the plurality of devices of the same type to the generated stimulus parameters to produce M×N response outputs, where M is a number of the plurality of devices of the same type; calculating, by the processor, a defect likelihood for a test set of the plurality of identical devices based upon a mean of a reference set of the plurality of identical devices response outputs, a mean of the test set response outputs, a standard deviation of reference set response outputs, and a standard deviation of the test set response outputs; determining, by the processor, that the defect likelihood for the test set is greater than a first threshold value; applying, by the processor, an initial step of a directed random search algorithm to update stimulus parameters in response to determining that the defect likelihood is greater than the first threshold; applying, by the built-in self-test devices, the updated stimulus parameters N times to the plurality of devices of the same type; measuring, by the plurality of devices of the same type, a response of the plurality of devices of the same type to the updated stimulus parameters to produce M×N updated response outputs; calculating, by the processor, a defect likelihood for the test set based upon a mean of the reference set updated response outputs, a mean of the test set updated response outputs, a standard deviation of reference set updated response outputs, and a standard deviation of the test set updated response outputs; and determining, by the processor, that the defect likelihood for the test set is greater than a second threshold, wherein the second threshold is greater than the first threshold.