The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 05, 2026

Filed:

Feb. 15, 2023
Applicant:

Geophysical Survey Systems, Inc., Nashua, NH (US);

Inventor:

Roger Roberts, Amesbury, MA (US);

Assignee:
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 27/26 (2006.01); G01N 33/38 (2006.01);
U.S. Cl.
CPC ...
G01R 27/2617 (2013.01); G01N 33/383 (2013.01);
Abstract

A method for calculating the change in percent voids between a reference location and a second location in a medium. The method includes obtaining a reference reflection coefficient of an electromagnetic wave reflection at the reference location, and a second reflection coefficient of an electromagnetic wave reflection at the second location. The obtained reflection coefficients are used to calculate a percent change in reflection coefficient. A reflection conversion factor correlating the change in the reflection coefficient to a change in percent voids in the medium is calculated and is used to calculate a change in percent voids between the reference and second locations based on the calculated percent change in reflection coefficients.


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Roberts, Roger. (2026). Methods for calculating a relative change in percent voids using electromagnetic wave reflection coefficients (U.S. Patent No. 12618883). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12618883

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