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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 12618834 B1

PDFFull Text
Date of Patent:
May. 05, 2026

Filed:

Mar. 04, 2022

Measurement sample preparation method, analysis method, reagent, and reagent kit

Applicants:

Sysmex Corporation, Kobe, JP;

Osaka University, Suita, JP;

National Institute of Advanced Industrial Science and Technology, Tokyo, JP;

Inventors:

Yuki Shimaoka, Kobe, JP;

Masaya Okada, Kobe, JP;

Shigeki Iwanaga, Kobe, JP;

Kazuki Bando, Suita, JP;

Katsumasa Fujita, Suita, JP;

Yasunori Nawa, Ikeda, JP;

Satoshi Fujita, Ikeda, JP;

Assignees:

SYSMEX CORPORATION, Kobe, JP;

OSAKA UNIVERSITY, Osaka, JP;

NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY, Tokyo, JP;

Attorney:

Sughrue Mion, PLLC

Primary Examiner:

Bao-Thuy L Nguyen

Assistant Examiner:

Christopher undefined Evans

Int. Cl.
CPC ...
G01N 33/543 (2006.01); G01N 21/25 (2006.01); G01N 21/31 (2006.01); G01N 21/65 (2006.01); G01N 33/58 (2006.01); G01N 33/68 (2006.01); G06N 3/08 (2023.01); G16C 20/20 (2019.01); G16C 20/70 (2019.01);
U.S. Cl.
CPC ...
G01N 33/54353 (2013.01); G01N 21/255 (2013.01); G01N 21/314 (2013.01); G01N 21/658 (2013.01); G01N 33/54346 (2013.01); G01N 33/588 (2013.01); G01N 33/6812 (2013.01); G06N 3/08 (2013.01); G16C 20/20 (2019.02); G01N 2201/121 (2013.01); G01N 2201/1296 (2013.01); G16C 20/70 (2019.02);
Abstract

Disclosed is a preparation method for preparing a measurement sample comprising an aggregate of metal nanoparticles having an analyte bound thereto, the preparation method comprising: contacting the analyte with a linker to bind the analyte to the linker; and contacting the linker that has been bound to the analyte with the metal nanoparticles to bind the linker to the metal nanoparticles.

Find Patent Forward Citations

Shimaoka, Yuki. (2026). Measurement sample preparation method, analysis method, reagent, and reagent kit (U.S. Patent No. 12618834). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12618834

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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