The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 05, 2026

Filed:

Feb. 24, 2023
Applicant:

Kabushiki Kaisha Toshiba, Tokyo, JP;

Inventors:

Yuki Ueda, Yokohama, JP;

Takashi Usui, Saitama, JP;

Assignee:

KABUSHIKI KAISHA TOSHIBA, Kawasaki, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 29/07 (2006.01); G01N 29/12 (2006.01);
U.S. Cl.
CPC ...
G01N 29/07 (2013.01); G01N 29/12 (2013.01);
Abstract

According to one embodiment, a structure evaluation system of an embodiment includes one or more sensors, a signal processing apparatus, and an evaluator. The plurality of sensors detect elastic waves generated from a structure. The signal processing apparatus calculates information on a frequency distribution by amplitude scale based on the plurality of elastic waves detected by each of the one or more sensors, and transmits the calculated information on the frequency distribution by amplitude scale in a wireless manner. The evaluator evaluates a state of deterioration of the structure based on the information on the frequency distribution by amplitude scale which is transmitted from the signal processing apparatus.


Find Patent Forward Citations

Ueda, Yuki. (2026). Structure evaluation system, signal processing apparatus, structure evaluation method, and non-transitory computer readable recording medium (U.S. Patent No. 12618806). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12618806

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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