The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 05, 2026
Filed:
Apr. 28, 2023
Fujifilm Corporation, Tokyo, JP;
Kimito Katsuyama, Tokyo, JP;
FUJIFILM Corporation, Tokyo, JP;
Abstract
Provided are an infrared image analysis device, an infrared image analysis method, and a program capable of correctly reducing a temperature gradient. An infrared thermal image analysis device () includes a processor. The processor acquires a first infrared thermal image of a structure surface, which is obtained by capturing a structure () to be inspected, acquires region information () that distinguishes a region of the structure surface corresponding to the first infrared thermal image for at least one region, estimates a temperature gradient in the at least one region based on the region information () and a second infrared thermal image, and reduces an influence of the temperature gradient from the first infrared thermal image.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile