The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 05, 2026

Filed:

Feb. 23, 2024
Applicant:

Shimadzu Corporation, Kyoto, JP;

Inventors:

Ryo Fujita, Kyoto, JP;

Hiroki Maeda, Kyoto, JP;

Naoki Morimoto, Kyoto, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 23/04 (2018.01); H05G 1/30 (2006.01);
U.S. Cl.
CPC ...
G01N 23/04 (2013.01); H05G 1/30 (2013.01); G01N 2223/204 (2013.01);
Abstract

This X-ray imaging apparatus is equipped with an X-ray tube, a detector for detecting X-rays emitted from the X-ray tube and transmitted through the subject, and an image processing unit for generating an image based on a detection signal output from the detector. The X-ray imaging apparatus is provided with a controller configured to cause X-rays to be emitted such that the distance between the plurality of focal positions of the plurality of electron beams on the inclined surface differs as viewed from the subject's side, depending on the size of the subject, by causing a part of the plurality of electron emitters to emit electron beams.


Find Patent Forward Citations

Fujita, Ryo. (2026). X-ray imaging apparatus (U.S. Patent No. 12618786). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12618786

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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