The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 05, 2026
Filed:
Feb. 26, 2024
Asahi Kasei Microdevices Corporation, Tokyo, JP;
Daiki Yasuda, Tokyo, JP;
Shota Isshiki, Tokyo, JP;
Asahi Kasei Microdevices Corporation, Tokyo, JP;
Abstract
An optical physical quantity measuring apparatus () includes a light-emitting element (L), light-receiving elements (S) including at least a first light-receiving element and a second light-receiving element, and a reflector. The light-emitting element has a different radiation spectrum depending on a radiation direction and emits light at least at a first radiation angle, a second radiation angle, and a third radiation angle into a space in which an object to be measured is located. The reflector causes light emitted from the light-emitting element in different radiation directions to reach different positions. The first light-receiving element is arranged in an optical path formed by light emitted at the first radiation angle. The second light-receiving element is arranged in an optical path formed by light emitted at the second radiation angle. An absorber or a void is provided in an optical path formed by light emitted at the third radiation angle.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile