The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 05, 2026
Filed:
Mar. 04, 2021
Hangzhou Hikvision Digital Technology Co., Ltd., Hangzhou, CN;
Xiaowang Cai, Hangzhou, CN;
HANGZHOU HIKVISION DIGITAL TECHNOLOGY CO., LTD., Hangzhou, CN;
Abstract
An infrared temperature measurement method, apparatus, device, and storage medium, which relate to the field of image processing is disclosed. The method comprises: determining a measurement temperature of a to-be-measured target based on a grayscale image captured to obtain a first measurement temperature; determining key point coordinates of the target based on a target image; determining a first distance based on the key point coordinates and configuration information of an infrared temperature measurement device, the first distance is a distance between the target and the infrared temperature measurement device; determining an actual temperature of the target based on the first measurement temperature and the first distance. In this way, the target image ranging and grayscale image temperature measurement can be combined, which not only reduces the influence of distance on the measurement temperature, but also avoids the problem of inaccurate measurement temperature when the distance does not meet the requirements.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile