The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 05, 2026

Filed:

Dec. 02, 2021
Applicant:

Ams International Ag, Jona, CH;

Inventor:

Fridolin Michel, Au, CH;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 6/42 (2024.01); A61B 6/00 (2006.01); G01T 1/178 (2006.01); G01T 1/24 (2006.01); G01T 1/29 (2006.01);
U.S. Cl.
CPC ...
A61B 6/4241 (2013.01); A61B 6/482 (2013.01); G01T 1/178 (2013.01); G01T 1/247 (2013.01); G01T 1/2928 (2013.01);
Abstract

An electric circuitry for baseline extraction in a photon counting system includes an input signal integrity detector to determine an integrity of an input signal for baseline extraction, a sampling circuit to sample the input signal during a sampling time, and to provide a sampled version of the input signal, a signal processing circuit to process the sampled version of the input signal, and a signal processing controller to control the signal processing circuit. The input signal integrity detector is configured to determine the integrity of the input signal for baseline extraction by evaluating the input signal or the sampled version of the input signal. The signal processing controller is configured to control the signal processing circuit so that the sampled version of the input signal is processed, when the integrity of the input signal for baseline extraction is determined by the input signal integrity detector at least during the sampling time.


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