The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 28, 2026

Filed:

Jul. 31, 2023
Applicant:

Meta Platforms Technologies, Llc, Menlo Park, CA (US);

Inventors:

Yee Sin Chan, San Francisco, CA (US);

Zhu Ji, Cupertino, CA (US);

Xiaodi Zhang, San Ramon, CA (US);

Jiansong Wang, Lincroft, NJ (US);

Curt Wong, Bellevue, WA (US);

Assignee:

Meta Platforms Technologies, LLC, Menlo Park, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04W 28/24 (2009.01); H04W 28/02 (2009.01);
U.S. Cl.
CPC ...
H04W 28/24 (2013.01); H04W 28/0268 (2013.01);
Abstract

Aspects of this technical solution can include identifying, by a wireless communication device, one or more of a plurality of data units corresponding to a set, the set configured according to a heuristic indicating a quality of service (QoS) level corresponding to the set. The wireless communication device can determine one or more metrics indicating respective states of the received plurality of data units. The wireless communication device can select according to the one or more metrics satisfying the heuristic, the set including the plurality of received data units corresponding to the set, from among a plurality of sets each having a corresponding QoS level. The wireless communication device can transmit, according to a set of one or more of the metrics satisfying the heuristic and according to the QoS level corresponding to the set, a set of one or more of the plurality of received data units corresponding to the one or more of the metrics.


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