The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 28, 2026
Filed:
Jan. 25, 2021
Applicant:
Beijing Xiaomi Mobile Software Co., Ltd., Beijing, CN;
Inventor:
Shengxiang Guo, Beijing, CN;
Assignee:
BEIJING XIAOMI MOBILE SOFTWARE CO., LTD., Beijing, CN;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 7/08 (2006.01); H04B 17/318 (2015.01); H04W 36/00 (2009.01);
U.S. Cl.
CPC ...
H04B 7/0888 (2013.01); H04B 17/328 (2023.05); H04W 36/0069 (2018.08);
Abstract
A method for beam measurement is performed by a terminal. The terminal communicates with a network on a first beam by means of a first communication channel. The method includes: in response to determining to measure a second beam, measuring the second beam by means of a second communication channel, wherein a frequency domain resource of the second beam is different from that of the first beam.
Guo, Shengxiang. (2026). Method and device for measuring a second beam via a second communication channel, in which a frequency domain resource of the second beam is different from a frequency resource of a first beam (U.S. Patent No. 12615079). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12615079
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile