The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 28, 2026

Filed:

Oct. 11, 2023
Applicant:

Contemporary Amperex Technology (Hong Kong) Limited, Hong Kong, CN;

Inventors:

Jiwei Chen, Ningde, CN;

Xuming Wang, Ningde, CN;

Yuanyuan Zhang, Ningde, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01M 10/04 (2006.01); G06T 7/00 (2017.01); H01M 10/48 (2006.01);
U.S. Cl.
CPC ...
H01M 10/0409 (2013.01); G06T 7/0004 (2013.01); H01M 10/48 (2013.01); G06T 2207/30108 (2013.01);
Abstract

A deviation detection method and a deviation detection device for detecting positional deviation of an electrode assembly during winding are provided. The method comprises: obtaining a plurality of first images and a plurality of second images by using a photographing unit during the winding process of the electrode assembly, where the first image includes a first electrode sheet, and the second image includes a second electrode sheet; matching a first image with a second image, where the first image and the second image contain the same or corresponding identification objects, and the identification objects are portions periodically formed on each winding layer of the electrode assembly; and determining whether the electrode assembly is deviated according to the boundary of the first electrode sheet in the first image and/or the boundary of the second electrode sheet in the second image in a group of matching first and second images.


Find Patent Forward Citations

Chen, Jiwei. (2026). Deviation detection method and deviation detection device (U.S. Patent No. 12614749). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12614749

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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