Semiconductor device and operating method using temperature-compensated pass permission bits

Abstract

A semiconductor device may include memory strings coupled between bit lines, respectively, and a source line, each of memory strings including memory cells coupled to word lines, and page buffers coupled to the bit lines, respectively, each of page buffers configured to output a verification result by sensing data that have been stored in memory cells that are coupled to each selected word line, among the memory strings, after a start of a verification operation of a program operation. The number of memory cells that have been programmed successfully and a pass permission bit may be compared based on a temperature of the semiconductor device and the verification result after the start of the verification operation of the program operation, wherein the pass permission bit corresponds to the temperature.