The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 28, 2026
Filed:
Aug. 08, 2024
Synaptics Incorporated, San Jose, CA (US);
Atul Sharma, Tokyo, JP;
Takashi Nose, Kanagawa, JP;
Hirobumi Furihata, Tokyo, JP;
Akio Sugiyama, Tokyo, JP;
SYNAPTICS INCORPORATED, San Jose, CA (US);
Abstract
A method for demura calibration is provided. The method includes acquiring a plurality of brightness maps of a plurality of light sources of a two-dimensional backlight system for a plurality of test patterns, each test pattern indicating each of the plurality of light sources to be turned on or off. Each of the plurality of light sources is turned on in only one of the plurality of test patterns. The plurality of brightness maps indicate brightness levels of the plurality of light sources for the plurality of test patterns. The method further includes producing a cumulative brightness map by adding together the plurality of brightness maps. The method further includes generating demura compensation factors for the plurality of light sources based on the cumulative brightness map.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile