The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 28, 2026

Filed:

Nov. 07, 2023
Applicant:

Contemporary Amperex Technology (Hong Kong) Limited, Hong Kong, CN;

Inventors:

Yinhang Tu, Ningde, CN;

Kunpeng Cui, Ningde, CN;

Yifei Gao, Ningde, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2022.01); G06V 10/44 (2022.01); G06V 20/69 (2022.01);
U.S. Cl.
CPC ...
G06V 20/698 (2022.01); G06V 10/44 (2022.01); G06V 20/695 (2022.01);
Abstract

The present application relates to a method, apparatus and system for inspecting a cell crush, a computer device, a storage medium, and a computer program product. The method may include: acquiring images of a flowing cell assembly by a high-speed image acquisition device; extracting image features from the images of the cell assembly; performing similarity matching between the image features and a preset crush model to obtain a similarity matching result; and obtaining a cell crush inspection result based on the similarity matching result.


Find Patent Forward Citations

Tu, Yinhang. (2026). Method, apparatus and system for inspecting cell crush (U.S. Patent No. 12614399). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12614399

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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