The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 28, 2026
Filed:
Nov. 18, 2021
Siemens Healthcare Gmbh, Erlangen, DE;
SIEMENS HEALTHINEERS AG, Forchheim, DE;
Abstract
A computer-implemented method of an embodiment is for automatically estimating and/or correcting an error due to artifacts in a multi-energy computed tomography result dataset relating to at least one target material. In an embodiment, the method includes determining at least one first subregion of the imaging region, which is free from the target material and contains at least one, in particular exactly one, second material with known material-specific energy dependence of x-ray attenuation; for each first subregion, comparing the image values of the energy dataset for each voxel, taking into account the known energy dependence, to determine deviation values indicative of artifacts; and for at least a part of the at least one remaining second subregion of the imaging region, calculating estimated deviation values by interpolating and/or extrapolating from the determined deviation values in the first subregion, the estimated deviation values being used as estimated error due to artifacts.