The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 28, 2026
Filed:
Apr. 11, 2024
Qualcomm Incorporated, San Diego, CA (US);
Yunxiao Shi, San Diego, CA (US);
Hong Cai, San Diego, CA (US);
Manish Kumar Singh, San Diego, CA (US);
Shizhong Steve Han, San Diego, CA (US);
Yinhao Zhu, La Jolla, CA (US);
Fatih Murat Porikli, San Diego, CA (US);
QUALCOMM Incorporated, San Diego, CA (US);
Abstract
Systems and techniques are provided for generating depth information from one or more images. For example, a process can include obtaining a first depth map corresponding to an input comprising an image of the one or more images and a sparse depth measurement. A three-dimensional (3D) point cloud can be generated based on the first depth map and multi-scale visual features of the input, wherein the 3D point cloud includes a plurality of 3D point features uplifted from the multi-scale visual features. At least a portion of the plurality of 3D point features can be processed using one or more self-attention layers to generate refined 3D point features. A two-dimensional (2D) projection of the refined 3D point features can be generated and a second depth map can be generated based on the 2D projection of the refined 3D point features.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile