The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 28, 2026
Filed:
Sep. 05, 2023
Lenovo (Beijing) Limited, Beijing, CN;
LENOVO (BEIJING) LIMITED, Beijing, CN;
Abstract
A defect detection method includes obtaining a first screen image and a second screen image of a screen module, in response to determining a defect area in the first screen image, determining an image feature correlation between the first screen image and the second screen image, and determining a defect detection result of the screen module based on the image feature correlation. The first screen image is an image displayed by a display screen collected when the display screen of the screen module is in a first test state. The second screen image is an image displayed by the display screen collected when the display screen is in a second test state. The defect area indicates that the screen module has a display defect.