The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 28, 2026

Filed:

Jun. 23, 2023
Applicant:

GE Infrastructure Technology Llc, Greenville, SC (US);

Inventors:

Kevin M. Fitzgerald, Atlanta, GA (US);

Stanley F. Simpson, Greenville, SC (US);

Arpit Jain, Fremont, CA (US);

Karen Kokal Maud, Greenville, SC (US);

Sabharish Murali, Bengaluru, IN;

Assignee:

GE Infastructure Technology LLC, Greenville, SC (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); G06T 5/50 (2006.01); G06T 17/00 (2006.01); G06V 10/44 (2022.01); G06V 10/764 (2022.01);
U.S. Cl.
CPC ...
G06T 7/0008 (2013.01); G06T 5/50 (2013.01); G06T 7/001 (2013.01); G06T 17/00 (2013.01); G06V 10/44 (2022.01); G06V 10/764 (2022.01); G06T 2207/20084 (2013.01); G06T 2207/20221 (2013.01);
Abstract

An inspection system is disclosed. The inspection system includes an image capturing system oriented to capture at least one component image of a component from at least one viewing angle, the at least one component image including a set of features selected to enable features of the components and features of defects on surfaces of the component to be identified, and a processor. The processor is configured to classify a type of defect detected on surfaces of the component in the at least one component image and assign zones to surfaces of the component captured in the at least one component image.


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