The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 28, 2026
Filed:
May. 16, 2022
Oracle International Corporation, Redwood Shores, CA (US);
Marija Nikolic, Zurich, CH;
Matteo Casserini, Zurich, CH;
Arno Schneuwly, Effretikon, CH;
Nikola Milojkovic, Dietikon, CH;
Milos Vasic, Zurich, CH;
Renata Khasanova, Zurich, CH;
Felix Schmidt, Baden-Dattwil, CH;
Oracle International Corporation, Redwood Shores, CA (US);
Abstract
The present invention relates to threshold estimation and calibration for anomaly detection. Herein are machine learning (ML) and extreme value theory (EVT) techniques for normalizing and thresholding anomaly scores without presuming a values distribution. In an embodiment, a computer receives many unnormalized anomaly scores and, according to peak over threshold (POT), selects a highest subset of the unnormalized anomaly scores that exceed a tail threshold. Based on the highest subset of the unnormalized anomaly scores, parameters of a probability density function are trained according to EVT. After training and in a production environment, a normalized anomaly score is generated based on an unnormalized anomaly score and the trained parameters of the probability density function. Anomaly detection compares the normalized anomaly score to an optimized anomaly threshold.