The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 28, 2026

Filed:

Dec. 11, 2023
Applicant:

Snowflake Inc., Menlo Park, CA (US);

Inventors:

Rishabh Gupta, San Francisco, CA (US);

Hrushikesh Shrinivas Paralikar, Hayward, CA (US);

Ryan Charles Quistorff, Bellevue, WA (US);

Assignee:

Snowflake Inc., Menlo Park, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 21/57 (2013.01);
U.S. Cl.
CPC ...
G06F 21/57 (2013.01);
Abstract

A data platform having an anti-abuse analysis pipeline is provided. The anti-abuse analysis pipeline detects an image referenced in an application package and schedules an application scan to scan application source files and generate application scan results. The anti-abuse analysis pipeline also schedules an image scan to scan the image and generate image scan results. The anti-abuse analysis pipeline extracts application source files from the application package and executes an application scan using the extracted application source files to generate application scan results. The anti-abuse analysis pipeline extracts artifacts from the referenced image and executes an image scan using the artifacts to generate image scan results. The anti-abuse analysis pipeline determines a completion of the application scan and the image scan and generates a scan result using the application scan results and image scan results.


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