The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 28, 2026

Filed:

Mar. 02, 2024
Applicant:

Microsoft Technology Licensing, Llc, Redmond, WA (US);

Inventors:

Simiao Zuo, Redmond, WA (US);

Pengfei Tang, Redmond, WA (US);

Xinyu Hu, Mountain View, CA (US);

Qiang Lou, Sammamish, WA (US);

Jian Jiao, Bellevue, WA (US);

Denis Xavier Charles, Redmond, WA (US);

Eren Manavoglu, Menlo Park, CA (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 16/9532 (2019.01); G06F 40/284 (2020.01);
U.S. Cl.
CPC ...
G06F 16/9532 (2019.01); G06F 40/284 (2020.01);
Abstract

A technique is described herein for training a tagging model that is able to successfully interpret queries. The technique trains the tagging model in plural stages. A first stage continues training a pre-trained language model based on a set of queries, to produce a first-stage model. A second stage performs training on the basis of a set of supplemented queries and associated weak labels, to produce a second-stage model. Each supplemented query combines a query with titles of documents that match the query. A third stage performs training on the basis of a set of supplemented queries and associated strong labels, to produce a third-stage model. The third stage also uses adversarial knowledge enhancement that has the effect of making the data presented to the third-stage model more difficult for the third-stage model to interpret. This, in turn, improves the generalization capabilities and robustness of the third-stage model.


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