The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 28, 2026
Filed:
Apr. 30, 2025
Applicant:
Owlting Usa, Inc., Arlington, VA (US);
Inventor:
Cheng-Wei Chen, New Taipei City, TW;
Assignee:
OwlTing USA, Inc., Arlington, VA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 16/334 (2025.01); G06F 16/22 (2019.01); G06F 16/23 (2019.01); G06F 40/30 (2020.01);
U.S. Cl.
CPC ...
G06F 16/3347 (2019.01); G06F 16/2237 (2019.01); G06F 16/2358 (2019.01); G06F 40/30 (2020.01);
Abstract
A system includes a processor, a memory, a storage medium, and a network interface. The system is configured to receive data from a first dataset and a second dataset. The system is configured to perform a method, including monitoring changes in the database structure, extracting metadata, embedding text fields, building an index, performing similarity searches, retrieving similar fields, using a RAG framework, a Machine Learning predicting, and comparing the results.
Chen, Cheng-Wei. (2026). Method for automatically mapping fields having similar characteristics (U.S. Patent No. 12613897). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12613897
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile