The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 28, 2026
Filed:
Nov. 23, 2023
Aiworkx Inc., Hwaseong-si, KR;
Jin Suk Lee, Seoul, KR;
Jung Hyun Im, Hanam-si, KR;
Seung Won Lee, Seoul, KR;
Yeon Jae Lee, Seoul, KR;
Woo Joo Kim, Seoul, KR;
Suk Won Yoon, Seoul, KR;
AIWORKX Inc., Hwaseong-si, KR;
Abstract
The present invention relates to an embedded device testing method. Preferably, the present invention relates to a function testing method for an embedded device designed to execute a specific function. The embedded device testing method having a hierarchical host structure executed on a computing device according to the present invention includes: receiving, by a main host, setting information for an execution environment of a target device; constructing a virtualized execution environment on a sub host according to the setting information; executing specific software or a specific test case in the constructed execution environment; and monitoring a result of the execution. According to the present invention, resources may be utilized efficiently because there is no need to newly configure and prepare physical hardware resources every time during the development and testing of an embedded device.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile