The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 28, 2026

Filed:

Mar. 01, 2023
Applicant:

Blackrock Finance, Inc., New York, NY (US);

Inventors:

Amit Panalkar, Johns Creek, GA (US);

Rishab Chauhan, Atlanta, GA (US);

Pranay Sharma, New York, NY (US);

Earvin Laxamana, New York, NY (US);

Assignee:

BlackRock Finance, Inc., New York, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 11/07 (2006.01);
U.S. Cl.
CPC ...
G06F 11/0769 (2013.01); G06F 11/0721 (2013.01); G06F 11/079 (2013.01);
Abstract

A system, method, and a computer program product for determining anomalies in a dataset are provided. The dataset, which stores data structures of parameters, is received at an anomaly detection framework. The anomaly detection framework selects multiple models, including time series models, historical models, artificial intelligence models and isolation forest models to analyze the parameters in the dataset and determine anomalies in the data structures.


Find Patent Forward Citations

Panalkar, Amit. (2026). Data science anomaly detection (U.S. Patent No. 12613761). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12613761

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…