The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 28, 2026
Filed:
Jan. 13, 2022
Nuctech Company Limited, Beijing, CN;
Tsinghua University, Beijing, CN;
Li Zhang, Beijing, CN;
Zhiqiang Chen, Beijing, CN;
Qingping Huang, Beijing, CN;
Jinning Liang, Beijing, CN;
Mingzhi Hong, Beijing, CN;
Yi Cheng, Beijing, CN;
Minghua Qiu, Beijing, CN;
Yao Zhang, Beijing, CN;
Jianxue Yang, Haidian, CN;
Lei Zheng, Beijing, CN;
NUCTECH COMPANY LIMITED, Beijing, CN;
Tsinghua University, Beijing, CN;
Abstract
A radiographic inspection device and a method of inspecting an object are provided. The radiographic inspection device includes: a support frame, where an inspection space applicable to inspect an object is formed within the support frame, and the inspection space has an opening connecting to an outside; a transfer mechanism applicable to carry the object to move through the inspection space; a shielding curtain mounted at the opening; and a driving mechanism mounted on the support frame and configured to drive the shielding curtain to move, in response to the object getting close to or moving away from the opening, so as to open or close the opening.