The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 28, 2026
Filed:
Mar. 13, 2024
Rohde & Schwarz Gmbh & Co. KG, Munich, DE;
Florian Ramian, Munich, DE;
Karolin Werthmueller, Munich, DE;
Rohde & Schwarz GmbH & Co. KG, Munich, DE;
Abstract
A test and measurement instrument includes an input configured to receive at least a waveform of a test signal, which includes a plurality of samples. The test and measurement instrument includes a processing circuit connected with the input. The processing circuit is configured to analyze the waveform and to select at least a subset of samples out of the plurality of samples. The subset of samples matches predefined criteria concerning at least one of bandwidth, amplitude distribution, and amplitude percentiles. The test and measurement instrument is configured to generate a modified waveform based on the selected subset of samples and/or to measure only a part of a received measurement signal from a device under test, which corresponds to the selected subset of samples. Further, a test and measurement setup and a method of measuring a device under test are described.