The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 28, 2026

Filed:

Mar. 14, 2024
Applicant:

Rohde & Schwarz Gmbh & Co. KG, Munich, DE;

Inventors:

Wolfgang Wendler, Munich, DE;

Jens Franke, Munich, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 29/08 (2006.01);
U.S. Cl.
CPC ...
G01R 29/0871 (2013.01);
Abstract

The present disclosure relates to a measurement instrument for measuring radio frequency signals. The measurement instrument is configured for analyzing a radio frequency signal received. The measurement instrument includes a measurement path configured for analyzing the radio frequency signal at a measurement frequency in a measurement bandwidth. The measurement instrument further includes a trigger path configured for signal detection at a trigger frequency in a trigger bandwidth. The trigger path is configured to trigger on the measurement path in the trigger bandwidth that is outside of the measurement bandwidth of the measurement path. Further, a measurement method is described.


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Wendler, Wolfgang. (2026). Measurement instrument for measuring radio frequency signals and a measurement method (U.S. Patent No. 12613263). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12613263

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