The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 28, 2026
Filed:
Aug. 27, 2020
Konica Minolta, Inc., Tokyo, JP;
Kazunao Maruyama, Saitama, JP;
Yoshiyuki Hashimoto, Hachioji, JP;
Sei Koh, Hachioji, JP;
Reiji Asano, Saitama, JP;
KONICA MINOLTA, INC., Tokyo, JP;
Abstract
An information processing system is for nondestructive inspection of a measurement target that is a magnetic material covered by a nonmagnetic body. The system includes an information processing device that reduces noise magnetic field components other than magnetic field components coming from the measurement target and/or emphasizes the magnetic field components coming from the measurement target in actual measurement data, based on the actual measurement data and virtual measurement data. The actual measurement data is obtained by applying a magnetic field to the measurement target and actually measuring a magnetic field coming from the measurement target using a magnetic sensor at a measurement position on a surface of the nonmagnetic body. The virtual measurement data is created under virtual conditions that are obtained by modifying actual measurement conditions.