The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 28, 2026
Filed:
Jan. 11, 2022
Tsinghua University, Beijing, CN;
Nuctech Company Limited, Beijing, CN;
Zhiqiang Chen, Beijing, CN;
Li Zhang, Beijing, CN;
Yi Cheng, Beijing, CN;
Qingping Huang, Beijing, CN;
Mingzhi Hong, Beijing, CN;
Minghua Qiu, Beijing, CN;
Yao Zhang, Beijing, CN;
Jianxue Yang, Beijing, CN;
Lei Zheng, Beijing, CN;
Tsinghua University, Beijing, CN;
NUCTECH COMPANY LIMITED, Beijing, CN;
Abstract
A radiographic inspection device and a method of inspecting an object are provided. The radiographic inspection device includes a support frame, where an inspection space applicable to inspect an object is formed within the support frame, and the inspection space has a first opening connecting to an outside; a transfer mechanism applicable to carry the object to move through the inspection space; a shielding curtain mounted at the first opening; and a driving mechanism mounted on the support frame and configured to drive the shielding curtain to move, so as to open or close the first opening. Since the driving mechanism drives the shielding curtain to rise or fall, it is possible to ensure that the lightweight object for inspection may smoothly enter the inspection space for subsequent radiographic scanning.