The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 28, 2026

Filed:

Oct. 02, 2023
Applicant:

Arkray, Inc., Kyoto, JP;

Inventors:

Fumito Hiramura, Kyoto, JP;

Alexander Turner, Kyoto, JP;

Assignee:

ARKRAY, Inc., Kyoto, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/84 (2006.01); G06K 7/10 (2006.01); H04N 23/74 (2023.01);
U.S. Cl.
CPC ...
G01N 21/8483 (2013.01); G06K 7/10861 (2013.01); H04N 23/74 (2023.01); G01N 2201/0221 (2013.01); G01N 2201/0692 (2013.01);
Abstract

A measurement system including: an insertion gate into which a test strip including first and second regions is inserted; a holder accommodating the test strip; a housing including a window facing the test strip; and a smart device including an illuminator illuminating the second region and including a camera imaging the first and second regions, in which the housing includes a mounting part placing the smart device on an outer surface of the housing in a state in which the camera and the illuminator are disposed at positions facing the window, and a measurement light source provided at a position to irradiate the first region, and in a case in which the camera images the first region, the illuminator is turned off while the measurement light source is turned on, and in a case in which the camera images the second region, the illuminator is turned on.


Find Patent Forward Citations

Hiramura, Fumito. (2026). Measurement system and measurement method (U.S. Patent No. 12613193). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12613193

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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