The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 28, 2026

Filed:

Jan. 29, 2024
Applicant:

Nano and Advanced Materials Institute Limited, Hong Kong, HK;

Inventors:

Li Fu, Hong Kong, HK;

Tao Xu, Hong Kong, HK;

Yam Chong, Hong Kong, HK;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01L 1/18 (2006.01); G01L 1/20 (2006.01);
U.S. Cl.
CPC ...
G01L 1/18 (2013.01); G01L 1/205 (2013.01);
Abstract

A pressure distribution monitoring flexible planar mat system with a wide pressure measuring range. The flexible planar mat includes a first electrode layer and a first composite piezoelectric-dielectric layer with a second composite piezoelectric-dielectric layer facing the first layer and a second electrode layer. Each of the first and second composite piezoelectric-dielectric layers includes an elastomeric matrix with conductive and dielectric particles embedded therein. The relative size of the conductive particles and the dielectric particles creates a micro-rough interface between these layers and the electrode layers resulting in a range of contact areas, permitting detection between 0 and 3000 kPa. The flexible planar mat system further includes a data collector that collects a pressure signal from the mat. A pressure distribution data processor receives and calculates data from the data collector and creates a two-dimensional pressure map from the flexible planar mat.


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