The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 28, 2026
Filed:
Apr. 18, 2024
Fujifilm Corporation, Tokyo, JP;
Kimi Ikeda, Shizuoka, JP;
FUJIFILM Corporation, Tokyo, JP;
Abstract
The present invention provides an inspection tool and an inspection method, with which it is possible to easily discriminate whether or not irradiation with light having a wavelength of 222 nm and light having a wavelength of 254 nm is performed even under sunlight. The inspection tool of the present invention includes a sensing portion and a reference portion, in which the sensing portion includes a sensing layer which senses at least light having a wavelength of 200 to 254 nm, the reference portion includes the sensing layer and a transparent layer, and the transparent layer satisfies a relationship of Expressions (1) and (2),0%≤TMA<15.0% Expression (1)50.0%<TMI≤100% Expression (2)