The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 28, 2026

Filed:

Mar. 14, 2022
Applicant:

Komatsu Ltd., Tokyo, JP;

Inventors:

Yohei Seki, Tokyo, JP;

Koji Kusaka, Tokyo, JP;

Yuki Hosoda, Tokyo, JP;

Assignee:

KOMATSU LTD., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
E02F 9/26 (2006.01);
U.S. Cl.
CPC ...
E02F 9/264 (2013.01);
Abstract

An abnormality determination system applicable to a work machine includes: a stereo camera mounted on a wheel loader having working equipment; a position data calculation unit that estimates a position of the working equipment in a captured image of the stereo camera based on a posture of the working equipment when captured by the stereo camera; and a determination unit that determines whether the stereo camera is normal based on the estimated position of the working equipment.


Find Patent Forward Citations

Seki, Yohei. (2026). Work machine abnormality determination system and work machine abnormality determination method (U.S. Patent No. 12612767). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12612767

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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