The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 28, 2026
Filed:
Dec. 21, 2020
Nihon Kohden Corporation, Tokyo, JP;
Osaka University, Osaka, JP;
Nihon Kohden Corporation, Tokyo, JP;
Osaka University, Osaka, JP;
Abstract
The presently disclosed subject matter provides a cell culture evaluation system including a measurement unit, a first storage unit, a second storage unit, an evaluation unit and an output unit, wherein the measurement unit includes a sensor that acquires evaluation target data about motion or a state of a culture tool; the first storage unit stores the evaluation target data; the second storage unit stores reference (tion unit compares the evaluation target data with the reference data so as to evaluate an execution state of a cell culture process; and the output unit outputs an evaluation result created by the evaluation unit.