The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 28, 2026

Filed:

Mar. 19, 2025
Applicant:

Visionnav Robotics Usa Inc., Acworth, GA (US);

Inventors:

Siqi Yang, Acworth, GA (US);

Bingchuan Yang, Acworth, GA (US);

Assignee:

VisionNav Robotics USA Inc., Acworth, GA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B66F 9/24 (2006.01); B66F 9/075 (2006.01); G01S 17/86 (2020.01); G05D 107/70 (2024.01);
U.S. Cl.
CPC ...
B66F 9/24 (2013.01); B66F 9/0755 (2013.01); G01S 17/86 (2020.01); G05D 2107/70 (2024.01);
Abstract

Disclosed are a method for determining an alignment state, a controller, and material handling equipment. A main technical solution includes: acquiring, by using a sensor, images and point clouds; extracting first target image data of a first target region from an image of a first stacking object, and extracting second target image data of a second target region from an image of a second stacking object; extracting, based on the first target image data, first target point cloud data; extracting, based on the second target image data, second target point cloud data; determining a pose of the first stacking object, and determining a pose of the second stacking object; determining a difference between the pose of the first stacking object and the pose of the second stacking object, and comparing the difference with a threshold to determine an alignment state between the first stacking object and the second stacking object.


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