The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 28, 2026
Filed:
Dec. 28, 2020
Aecc Shanghai Commercial Aircraft Engine Manufacturing Co., Ltd., Shanghai, CN;
Aecc Commercial Aircraft Engine Co., Ltd., Shanghai, CN;
Yali Li, Shanghai, CN;
Liming Lei, Shanghai, CN;
Xiaohui Chen, Shanghai, CN;
Jun Fu, Shanghai, CN;
Fei Chang, Shanghai, CN;
AECC SHANGHAI COMMERCIAL AIRCRAFT ENGINE MANUFACTURING CO., LTD., Shanghai, CN;
AECC COMMERCIAL AIRCRAFT ENGINE CO., LTD., Shanghai, CN;
Abstract
A non-destructive testing method for crack defects, and a testing standard part and a manufacturing method thereof, used for the non-destructive testing of crack defects of an additive manufacturing workpiece. The manufacturing method of the crack defect standard part comprises: step A, setting a crack defect area of the standard part, in the crack defect area, the proportion of the crack defects in the crack defect area is set as a first proportion value; step B, selecting an additive manufacturing forming process for manufacturing the crack defect area to obtain a first process parameter of the additive manufacturing forming process corresponding to the first proportion value; and step C, performing the additive manufacturing forming process based on the first process parameter to form the crack defect area. The non-destructive testing method for crack defects of the present invention has the advantages of accurate and reliable testing results.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile